International Conference on X-Ray Microscopy (XRM)
GenrePhysics Conference
Location(s)changes every time
InauguratedGöttingen 1983
Most recentHsinchu 2022
Next eventLund 2024
Attendance300-400
WebsiteXRM2024

The International Conference on X-Ray Microscopy (XRM) is a biennial international conference on X-ray imaging. The scope includes a range of topics in X-ray imaging, both in the soft and hard X-ray spectrum. Imaging by synchrotron light sources is the dominant topic, but small scale laboratory imaging is also included in many talks and posters. A number of subtopics are covered, including but not limited to X-ray microtomography, Phase-contrast X-ray imaging, Ptychography, and X-ray optics. The conference is typically five days long and held in summer. The conference is organized by an international committee and a local host organization. This local host is in most cases a synchrotron facility or an institute closely connected to a synchrotron. The host of the conference is decided two conferences in advance with a majority vote by all conference attendees. For example, the 14th XRM (2018) was decided during the 12th XRM (2014).

History

The initiators of XRM were the German physicist Günter Schmahl and the Hungarian-American physicist Janos Kirz. Schmahl hosted the first conference in Göttingen in 1983.[1][2]

XRM was for several years triennial, but has been biennial since 2008.

The 2020 installment of XRM in Taiwan was postponed two years due to the COVID-19 pandemic.

The Werner Meyer-Ilse Memorial Award

Werner Meyer-Ilse was the chair of the International Program Committee for XRM99, but passed away in a car accident days before the conference.[3][4] In his memory XRM hands out the Werner Meyer-Ilse Memorial Award to "young scientists for exceptional contributions to the advancement of X-ray microscopy".[5]

Previous Recipients

  • 1999: Daniel Weiss and Jianwei Miao
  • 2002: Michael Feser
  • 2005: Weilun Chao
  • 2008: Anne Sakdinawat and Pierre Thibault
  • 2010: Christian Holzner
  • 2012: Irene Zanette and Stephan Werner
  • 2014: Kevin Mader
  • 2016: Junjing Deng and Matias Kagias
  • 2018: Claire Donnelly and Marie-Christine Zdora
  • 2020: Jumpei Yamada (awarded 2022)
  • 2022: Yanqi Luo and Jisoo Kim

List of XRM conference

# year name city country attendance[a] proceedings comment
1 1983 XRM I Göttingen Germany 50 [2] [6] First conference
2 1987 XRM II Brookhaven, NY. US [7]
3 1990 XRM III London UK [8]
4 1993 XRM IV Chernogolovka Russia [9]
5 1996 XRM V Würzburg Germany [10]
6 1999 XRM99 Berkeley, CA. US [11] First WMIM award
7 2002 XRM2002 Grenoble France 239 [12]
8 2005 XRM2005 Himeji Japan [13] First conference outside Europe and US
9 2008 XRM2008 Zürich Switzerland 300 [14]
10 2010 XRM2010 Chicago, Il. US 344 [15]
11 2012 XRM2012 Shanghai China 295 [16]
12 2014 XRM2014 Melbourne Australia 336 [2]
13 2016 XRM2016 Oxford UK 380 [5]
14 2018 XRM2018 Saskatoon Canada [17]
15 2022 XRM2022 Hsinchu Taiwan Virtual, originally planned as XRM2020
16 2024 XRM2024 Lund Sweden Originally planned as XRM2022
17 2026 XRM2026 Campinas Brazil

See also

Notes

a Attendance numbers are taken from their respective proceedings.

References

  1. ↑ "About XRM". XRM2022. Retrieved 2022-02-09.
  2. 1 2 3 de Jonge, Martin D.; Paterson, David J.; Ryan, Christopher G., eds. (2016). "XRM 2014". XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy. AIP Conference Proceedings. Vol. 1696. American Institute of Physics.
  3. ↑ "Werner Meyer-Ilse Award". XRM2022. Retrieved 2022-02-10.
  4. ↑ "ALS Scientist Dies Following Car Crash". Berkeley Lab. Retrieved 2022-02-10.
  5. 1 2 "XRM2016". X-Ray Microscopy Conference 2016 (XRM 2016) 15–19 August 2016, Oxford University, United Kingdom. Journal of Physics: Conference Series. Vol. 849. IOP Publishing. 2017.
  6. ↑ Schmal, Günter; Rudolph, Dietbert, eds. (1984). "X-Ray Microscopy". X-Ray Microscopy: Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983. Springer Series in Optical Sciences. Vol. 43. Springer. doi:10.1007/978-3-540-38833-3.
  7. ↑ Sayre, David; Kirz, Janos; Howells, Malcolm; Rarback, Harvey, eds. (1988). "X-Ray Microscopy II". X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987. Springer Series in Optical Sciences. Vol. 56. Springer. doi:10.1007/978-3-540-39246-0.
  8. ↑ Michette, Alan G.; Morrison, Graeme R.; Buckley, Christopher J., eds. (1992). "X-Ray Microscopy III". X-Ray Microscopy III: Proceedings of the Third International Conference, London, September 3–7, 1990. Springer Series in Optical Sciences. Vol. 67. Springer. doi:10.1007/978-3-540-46887-5.
  9. ↑ Aristov, V. V.; Erko, A. I., eds. (1994). X-Ray Microscopy IV.
  10. ↑ Thieme, Jürgen; Schmal, Günter; Rudolph, Dietbert; Umbach, Eberhard, eds. (1998). "X-Ray Microscopy and Spectromicroscopy". X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996. Springer. doi:10.1007/978-3-642-72106-9.
  11. ↑ Warwick, Tony; Meyer-Ilse, Werner; Attwood, David, eds. (2000). "X-RAY MICROSCOPY". X-RAY MICROSCOPY: Proceedings of the VI International Conference. AIP Conference Proceedings. Vol. 507. American Institute of Physics.
  12. ↑ Susini, J.; Joyeux, D.; Polack, F., eds. (2000). "7th International Conference on X-Ray Microscopy". 7th International Conference on X-Ray Microscopy. J. Phys. IV France. Vol. 104. EDP Sciences.
  13. ↑ "XRM2005". Proc. 8th Int. Conf. on X-ray Microscopy. IPAP Conference Series. Vol. 7. Institute of Pure and Applied Physics, Japan. 2006.
  14. ↑ "XRM2008". 9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 21–25 July 2008, Zürich, Switzerland. Journal of Physics: Conference Series. Vol. 186. IOP Publishing. 2009.
  15. ↑ McNulty, Ian; Eyberger, Catherine; Lai, Barry, eds. (2011). "XRM 2010". XRM 2010: THE 10TH INTERNATIONAL CONFERENCE ON X‐RAY MICROSCOPY. AIP Conference Proceedings. Vol. 1365. American Institute of Physics.
  16. ↑ "XRM2012". 11th International Conference on X-ray Microscopy (XRM2012) 5–10 August 2012, Shanghai, China. Journal of Physics: Conference Series. Vol. 463. IOP Publishing. 2013.
  17. ↑ "XRM2016". Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018). Microscopy and Microanalysis. Vol. 24(S2). Cambridge University Press. 2018.
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