TeraView Ltd
IndustrySemiconductors
Founded2001 (from Toshiba Research Europe)
FounderMichael Pepper, Don Arnone (from Toshiba Research Europe)
HeadquartersPlatinum Building, St John's Innovation Park,
Cambridge,
United Kingdom
Area served
Worldwide
Key people
Don Arnone (CEO)
Sir Michael Pepper (Chief Scientific Director)
ProductsTerahertz imaging and spectroscopy equipment
Number of employees
24 (2013)
WebsiteTeraView

TeraView Limited, or TeraView, is a company that designs terahertz imaging and spectroscopy instruments and equipment for measurement and evaluation of pharmaceutical tablets, nanomaterials, ceramics and composites, integrated circuit chips and more.[1]

TeraView was co-founded by Michael Pepper (CSO) and Dr Don Arnone (CEO) as a spin-out of Toshiba Research Europe in April 2001.[2] The company was set up to exploit the intellectual property and expertise developed in sourcing and detecting terahertz radiation (1 THz= 33.3 cm−1), using semiconductor technologies. Leading industry proponents of the technology sit on its Advisory Board, and TeraView maintains close links with the Cavendish Laboratory[3] at the University of Cambridge, which was one of the research universities which had an interest in Terahertz techniques. It is also where Professor Pepper,[4] has held the position of Professor of Physics since 1987.

Products

TeraView has developed a number of instruments that harness the properties of terahertz radiation.[5] Terahertz light has some interesting application. Many common materials and living tissues are semi-transparent and have ‘terahertz fingerprints’,[6][7] permitting them to be imaged, identified, and analyzed. Moreover, the non-ionizing properties of terahertz radiation and the relatively low power levels used indicate that it is safe.[8]

By applying different software analysis packages, the same base technologies can be brought to bear to several applications.

Research and development areas

The company's primary focus of investigation includes the development of terahertz light into a useful spectroscopic and imaging technique. The ‘terahertz gap’ – where until recently bright sources of light and sensitive means of detection were difficult to access – encompasses frequencies invisible to the naked eye in the electromagnetic spectrum, lying between microwave and infrared in the range from 0.3 to 3THz. TeraView's existing instruments generate, detect and manipulate THz light and have been tested in a number of application areas.

Pharmaceutical industry

The applications of terahertz radiation in the pharmaceutical industry include nondestructive estimation of critical quality attributes in pharmaceutical products[9][10] such as crystalline structure,[11] thickness and chemical composition analysis.[12] TeraView has demonstrated that terahertz instruments can produce 3D coating thickness maps[13] for multiple coating layers[14] and structural features models[15] allowing better understanding and control of product scale up and manufacture.[16]

Medical imaging

Due in part to its ability to recognize spectral fingerprints, terahertz pulsed imaging can be applied to provide contrast between different types of soft tissue.[17] Also, it is a sensitive means of detecting the degree of water content[18] and markers of cancer[19] and other diseases.[20][21] Attempts have been made to apply Terahertz to image cancers like breast,[22] cancer as well as other diseases in medicine, oral health care, and related areas. The company announced it has been cleared by the Medicines and Healthcare products Regulatory Agency (MHRA) to trial in-vivo terahertz spectroscopy for bio-medical research.[23] The trials will be held in Guy's Hospital in London and aim to determine if the technology can be applied real-time for accurate removal of cancer tissue.[24]

Homeland security and defense

Terahertz technology has the potential[25] to safely, noninvasively and quickly image through different types of clothing and other concealment and confusion materials.[26] It has been hypothesized that because THz light is absorbed by explosive materials[27] at certain frequencies it may be possible to find unique 'terahertz fingerprints'[28] that can be distinguished from clothing or other materials.[29] This has never been proved in a practical sense. The company's technology has been used by the Naval Surface Warfare Command to test the presence of different types of plastic explosives through clothing, including PETN (Pentaerythritol tetranitrate).[30]

Material characterization

THz spectroscopy can be used as a non-contact analytical method.[31] The absorption coefficient and refractive index[32] measured by terahertz pulsed spectroscopy can be used directly to obtain the high frequency-dependent complex conductivities of materials[33] in the 0.1 – 3 THz (3 – 100 cm−1) region of the electromagnetic spectrum.[34] The technology has been applied to some areas of solid state physics research such as semiconductors,[35] high-temperature superconductors,[36] terahertz metamaterials, carrier density dynamics, graphene,[37] carbon nanotubes,[33] magnetism and more.[38]

Nondestructive testing

Terahertz light can be used as non-contact technique for analysis in material integrity studies. It has proved to be effective in nondestructive inspection of layers in paints and coatings,[39] detecting structural defects in ceramic and composite materials[40] and imaging the physical structure of paintings and manuscripts.[41][42] The use of THz waves for non-destructive evaluation enables inspection of multi-layered structures and can identify abnormalities from foreign material inclusions, disbond and delamination, mechanical impact damage, heat damage, and water or hydraulic fluid ingression.[43] The company's Chief Scientific Director, Sir Michael Pepper, explains that THz imaging can measure thickness across a substrate precisely and it can also obtain the density of the coating: "The radiation is reflected each time there is a change in material. The time of arrival is measured and then various algorithms complete the picture by developing 3D fine feature images and precise material identifications".[44] Further research by the company and active collaboration with the University of Cambridge is aiming to develop a terahertz sensor that can be used to measure the quality of paint coatings on cars.[45]

Semiconductor industry

Terahertz technology allows high resolution 3D imaging of semiconductor packages and integrated circuit devices.[35] THz time-domain reflectometry (TDR) offers significant advantages in imaging resolution compared to existing fault isolation techniques and conventional millimetre wave systems.[46] Working with Intel on the applications of THz technology for the semiconductor industry, TeraView developed a new technique which combines electro-optics and THz pulses in a non-destructive Electro Optical Terahertz Pulse Reflectometry (EOTPR) which operates at up to 2 THz with resolution of 10 μm for improved fault isolation and failure analysis process-flow studies.[47] "The unique capabilities of terahertz TDR and its advantages over the conventional TDR have been recognized. With such revolutionary concept, innovative design and superior performance, EOTPR will become an essential tool for microelectronic package fault isolation and failure analysis." Yongming Cai, Zhiyong Wang, Rajen Dias, and Deepak Goyal, Intel Corporation.[48]

See also

References

  1. ↑ "TeraView Company Overview"
  2. ↑ "About TeraView"
  3. ↑ "University of Cambridge Enterprise"
  4. ↑ "University College London, Department of Electronic and Electrical Engineering and the London Centre for Nanotechnology"
  5. 1 2 3 Zhang, Caihong; Jin, Biaobing; Chen, Jian; Wu, Peiheng; Tonouchi, Masayoshi; Deibel, Jason A; Stoik, Christopher D; Bohn, Matthew J (2009). "Terahertz Equipment for Imaging and Spectroscopy". Journal of the Optical Society of America B. 26 (9): A1. Bibcode:2009JOSAB..26A...1Z. doi:10.1364/JOSAB.26.0000A1. Retrieved 14 February 2013.
  6. ↑ "What is Terahertz? - Terahertz fingerprints"
  7. ↑ Ho, Louise; Pepper, Michael; Taday, Philip (2008). "Terahertz spectroscopy: Signatures and fingerprints". Nature Photonics. 2 (9): 541–3. Bibcode:2008NaPho...2..541H. doi:10.1038/nphoton.2008.174.
  8. ↑ Mueller, Eric R. (August–September 2003). "Terahertz Radiation: Applications and Sources". The Industrial Physicist. 9 (4): 27–9. Archived from the original on 2003-12-04.
  9. ↑ "Solid Dosage-forms Analysis of Tablets with Terahertz Imaging".
  10. ↑ Shen, Yao-Chun; Taday, Philip F. (2008). "Development and Application of Terahertz Pulsed Imaging for Nondestructive Inspection of Pharmaceutical Tablet". IEEE Journal of Selected Topics in Quantum Electronics. 14 (2): 407–15. Bibcode:2008IJSTQ..14..407S. CiteSeerX 10.1.1.714.8549. doi:10.1109/JSTQE.2007.911309. S2CID 23139230.
  11. ↑ Savage, Lynn (February 2012). "Terahertz Techniques Reveal the Hidden World of Pharmaceuticals". BioPhotonics.
  12. ↑ Taday, P.F.; Bradley, I.V.; Arnone, D.D.; Pepper, M. (2003). "Using terahertz pulse spectroscopy to study the crystalline structure of a drug: A case study of the polymorphs of ranitidine hydrochloride". Journal of Pharmaceutical Sciences. 92 (4): 831–8. doi:10.1002/jps.10358. PMID 12661068.
  13. ↑ Fitzgerald, Anthony J.; Cole, Bryan E.; Taday, Philip F. (2005). "Nondestructive analysis of tablet coating thicknesses using terahertz pulsed imaging". Journal of Pharmaceutical Sciences. 94 (1): 177–83. doi:10.1002/jps.20225. PMID 15761941.
  14. ↑ Zeitler, J. Axel; Shen, Yaochun; Baker, Colin; Taday, Philip F.; Pepper, Michael; Rades, Thomas (2007). "Analysis of coating structures and interfaces in solid oral dosage forms by three dimensional terahertz pulsed imaging". Journal of Pharmaceutical Sciences. 96 (2): 330–40. CiteSeerX 10.1.1.670.7797. doi:10.1002/jps.20789. PMID 17075850.
  15. ↑ "University of Cambridge, Department of Chemical Engineering and Biotechnology - Terahertz Imaging - Pharmaceutical Applications"
  16. ↑ "Process Analytical Technology (PAT) Tool for In-line Measurement and Control of Tablet Coating Thickness"
  17. ↑ "Terahertz Medical Imaging"
  18. ↑ "Terahertz radiation targets skin cancer"
  19. ↑ "Terahertz Light to Illuminate Cell Biology and Cancer Research"
  20. ↑ Yu, Calvin; Fan, Shuting; Sun, Yiwen; Pickwell-MacPherson, Emma (2012). "The potential of terahertz imaging for cancer diagnosis: A review of investigations to date". Quantitative Imaging in Medicine and Surgery. 2 (1): 33–45. doi:10.3978/j.issn.2223-4292.2012.01.04. PMC 3496499. PMID 23256057.
  21. ↑ Brun, M-A; Formanek, F; Yasuda, A; Sekine, M; Ando, N; Eishii, Y (2010). "Terahertz imaging applied to cancer diagnosis". Physics in Medicine and Biology. 55 (16): 4615–23. Bibcode:2010PMB....55.4615B. doi:10.1088/0031-9155/55/16/001. PMID 20671358. S2CID 1522304.
  22. ↑ "TeraView trials in vivo THz spectroscopy"
  23. ↑ "TeraView trials in vivo THz spectroscopy". Optics.org. 16 July 2012.
  24. ↑ "Use Of Terahertz As An Intra-Operative Tool During Breast Cancer Surgery". TeraView.
  25. ↑ "Ned Potter, ABC News - T-Rays: The Future of Airport Security, the End of Suicide Bombers?"
  26. ↑ "Larry Hardesty, MIT News Office - A laser that generates terahertz rays — which can detect explosives — operates at higher temperatures than some thought possible"
  27. ↑ David J. Cook. Brian K. Decker. Mark G. Allen (2005). "Quantitative THz Spectroscopy of Explosive Materials" (PDF). Optical Society of America. {{cite journal}}: Cite journal requires |journal= (help)
  28. ↑ "Science Daily - Breakthrough in Terahertz Remote Sensing: Unique THz 'Fingerprints' Will Identify Hidden Explosives from a Distance"
  29. ↑ Leahy-Hoppa, M.R.; Fitch, M.J.; Zheng, X.; Hayden, L.M.; Osiander, R. (2007). "Wideband terahertz spectroscopy of explosives". Chemical Physics Letters. 434 (4–6): 227–30. Bibcode:2007CPL...434..227L. doi:10.1016/j.cplett.2006.12.015.
  30. ↑ "TeraView THz Technology Used to Detect PETN Explosive". TeraView.
  31. ↑ Zhang, Caihong; Jin, Biaobing; Chen, Jian; Wu, Peiheng; Tonouchi, Masayoshi (2009). "Noncontact evaluation of nondoped InP wafers by terahertz time-domain spectroscopy". Journal of the Optical Society of America B. 26 (9): 1. Bibcode:2009JOSAB..26....1Z. doi:10.1364/JOSAB.26.0000A1.
  32. ↑ Folks, William R.; Pandey, Sidhartha K.; Boreman, Glenn (2007). "Refractive Index at THz Frequencies of Various Plastics". Optical Terahertz Science and Technology. pp. MD10. doi:10.1364/OTST.2007.MD10. ISBN 978-1-55752-837-7.
  33. 1 2 Kang, Chul; Maeng, In Hee; Oh, Seung Jae; Son, Joo-Hiuk; Jeon, Tae-In; An, Kay Hyeok; Lim, Seong Chu; Lee, Young Hee (2005). "Frequency-dependent optical constants and conductivities of hydrogen-functionalized single-walled carbon nanotubes". Applied Physics Letters. 87 (4): 041908. Bibcode:2005ApPhL..87d1908K. doi:10.1063/1.1999015. S2CID 121225863.
  34. ↑ "Terahertz for Material Characterization"
  35. 1 2 Chin, Jiann Min; Narang, Vinod; Zhao, Xiaole; Tay, Meng Yeow; Phoa, Angeline; Ravikumar, Venkat; Ei, Lwin Hnin; Lim, Soon Huat; et al. (2011). "Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview". Microelectronics Reliability. 51 (9–11): 1440–8. doi:10.1016/j.microrel.2011.06.061.
  36. ↑ Hancock, Jason N.; Van Mechelen, J. L. M.; Kuzmenko, Alexey B.; Van Der Marel, Dirk; Brüne, Christoph; Novik, Elena G.; Astakhov, Georgy V.; Buhmann, Hartmut; Molenkamp, Laurens W. (2011). "Surface State Charge Dynamics of a High-Mobility Three-Dimensional Topological Insulator". Physical Review Letters (Submitted manuscript). 107 (13): 136803. arXiv:1105.0884. Bibcode:2011PhRvL.107m6803H. doi:10.1103/PhysRevLett.107.136803. PMID 22026887. S2CID 13306466.
  37. ↑ Lee, Seung Hoon; Choi, Muhan; Kim, Teun-Teun; Lee, Seungwoo; Liu, Ming; Yin, Xiaobo; Choi, Hong Kyw; Lee, Seung S.; et al. (2012). "Switching terahertz waves with gate-controlled active graphene metamaterials". Nature Materials. 11 (11): 936–41. arXiv:1203.0743. Bibcode:2012NatMa..11..936L. doi:10.1038/nmat3433. PMID 23023552. S2CID 13672700.
  38. ↑ Hogan, Mark. "THz Radiation". SLAC National Accelerator Laboratory.
  39. ↑ Petkie, Douglas T.; Kemp, Izaak V.; Benton, Carla; Boyer, Christopher; Owens, Lindsay; Deibel, Jason A.; Stoik, Christopher D.; Bohn, Matthew J. (2009). Krapels, Keith A; Salmon, Neil A (eds.). "Nondestructive terahertz imaging for aerospace applications". Millimetre Wave and Terahertz Sensors and Technology II. 7485: 74850D. Bibcode:2009SPIE.7485E..0DP. doi:10.1117/12.830540. S2CID 109221462.
  40. ↑ Jonuscheit, Joachim. "Technical ceramics: tracking down defects" (PDF). Fraunhofer Institute for Physical Measurement Techniques IPM. Archived from the original (PDF) on 2013-06-15.
  41. ↑ Pastorelli, Gianluca; Trafela, Tanja; Taday, Phillip F.; Portieri, Alessia; Lowe, David; Fukunaga, Kaori; Strlič, Matija (2012). "Characterisation of historic plastics using terahertz time-domain spectroscopy and pulsed imaging". Analytical and Bioanalytical Chemistry. 403 (5): 1405–14. doi:10.1007/s00216-012-5931-9. PMID 22447218. S2CID 9504225.
  42. ↑ "Terahertz for Conservation of Paintings, Manuscripts and Artefacts". TeraView. Archived from the original on 2013-06-03. Retrieved 2013-02-20.
  43. ↑ Hsu, David K.; Im, Kwang-Hee; Chiou, Chien-Ping; Barnard, Daniel J.; Thompson, Donald O.; Chimenti, Dale E. (2011). "An Exploration of the Utilities of Terahertz Waves for the Nde of Composites". Review of Progress in Quantitative Nondestructive Evaluation. AIP Conference Proceedings. Vol. 30B. pp. 533–40. Bibcode:2011AIPC.1335..533H. doi:10.1063/1.3591897. ISBN 978-0-7354-0888-3. S2CID 4331137. {{cite book}}: |journal= ignored (help)
  44. ↑ Gunnar, William. "TeraView Brings New Techniques to the Study of Industrial Coatings". Industrial Coatings World.
  45. ↑ Wilson, Dave (22 August 2012). "Terahertz sensor to measure paint quality on automobiles". Vision Systems.
  46. ↑ Nagel, Michael; Michalski, Alexander; Kurz, Heinrich (2011). "Contact-free fault location and imaging with on-chip terahertz time-domain reflectometry". Optics Express. 19 (13): 12509–14. Bibcode:2011OExpr..1912509N. doi:10.1364/OE.19.012509. PMID 21716491.
  47. ↑ Cai, Yongming. "Fault isolation uses terahertz time-domain reflectometry technique". Laser Focus World.
  48. ↑ "Fault Analysis in Advanced Semiconductor Packages using Terahertz Time Domain Reflectometry". TeraView.

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